High pressure Xenon short-arc lamp with two reservoirs which are selectively connectable to the lamp's envelope is described. One reservoir contains an absorbent which will absorb both Xenon and contaminant gases such as CO2 and O2. The absorbent temperature is controlled to evacuate the envelope of both the Xenon and the contaminant gases. The temperature of the absorbent is then raised to desorb only clean Xenon while retaining the contaminant gases, thereby clearing the envelope of the contaminant gases. The second reservoir contains a gas whose specific purpose is, to remove the objectional metal film which deposits gradually on the interior surface of the lamp envelope during normal arc operation. The origin of the film is metal transferred from the cathode of the arc lamp by sputtering or other gas transfer processes.